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Metrologic Accused Of Patent Infringement


Blackwood, New Jersey – Metrologic Instruments, Inc. (NASDAQ-NMS:MTLG), today announced that on May 10, 2006, PSC Scanning, Inc., a subsidiary of PSC Inc., filed a Complaint against Metrologic Instruments, Inc. in the United States District Court in Oregon. The essence of the claim is that Metrologic’s Stratos product line of bi-optic scanners infringes two PSC patents. The suit seeks equitable relief and damages. Metrologic strongly disputes these claims and intends to vigorously defend this action and its intellectual property.

As reported in our first quarter earnings press release on May 9, 2006, Metrologic continues to show dramatic revenue growth and is gaining market share as verified by independent research organizations, outpacing the industry at large. Our consistent ability to grow sales extends to many product lines across the globe, allowing us to make inroads into markets previously dominated by only one or two manufacturers.

Metrologic’s Stratos product fa

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Public users may perform preliminary searches of patent information in a variety of formats including on-line, microfilm, and print at the United States Patent and Trademark Office (USPTO) Public Search Facility located in Alexandria, VA. State of the art computer workstations provide automated searching of patents issued from 1790 to the current week of issue. Full document text may be searched on U.S. patents issued since 1971 and OCR text from 1920 to 1970. U.S. patent images from 1790 to the present may be retrieved for viewing or printing. Some foreign patent documents are available.

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 Helpful Patent Terms

Drawing

Definition:
Patent drawings must show every feature of the invention as specified in the claims. Omission of drawings may cause an application to be considered incomplete.

Descriptive Mark

Definition:
A mark is considered merely descriptive if it describes an ingredient, quality, characteristic, function, feature, purpose or use of the specified goods or services.

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